Title :
Millimeter-Wave Phaseless Antenna Characterization
Author :
Capozzoli, Amedeo ; Curcio, Claudio ; Elia, Giuseppe D. ; Liseno, Angelo
Author_Institution :
Dipt. di Ing. Elettron. e delle Telecomun., Univ. di Napoli Federico II, Naples
fDate :
7/1/2008 12:00:00 AM
Abstract :
Phaseless antenna characterization at millimeter-wave frequencies is an awkward task for a number of reasons. First, suitable network analyzers appropriately working at a high frequency, as well as a complex hardware ensuring high positioning and alignment accuracies, are required. Furthermore, the characterization algorithm should be reliable and accurate and should require a reasonable measurement time, which is a key issue in the millimeter and submillimeter ranges. In this paper, we present an efficient algorithm that faces this problem by exploiting the available a priori information on the shape and size of the antenna. The reliability, accuracy, and stability of the approach reside on ldquoeffectiverdquo expansions of the unknown aperture field distribution, reducing the ldquoeffectiverdquo number of unknowns. ldquoFastrdquo acquisitions are enabled by nonuniformly distributed near-field measurements. Rectangular and circular apertures are dealt with by introducing prolate spheroidal wave functions and a Jacobi-Bessel series representation of the aperture field, respectively. The performances of the approach and its effectiveness in the millimeter frequency range are proven by the experimental results at 40, 94, and 100 GHz, made at the Antenna Laboratory of the University of Napoli Federico II, on horn antennas and a Cassegrain reflector.
Keywords :
Bessel functions; antenna radiation patterns; aperture antennas; millimetre wave antennas; Jacobi-Bessel series representation; aperture antenna radiation; circular apertures; millimeter-wave phaseless antenna characterization algorithm; network analyzers; prolate spheroidal wave functions; rectangular apertures; Antenna measurements; millimeter-wave antennas; near-field characterization; phase retrieval; phaseless near-field/far-field transformations;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.917186