Title :
High Q-value resonators for the SHF-region based on TBCCO-films
Author :
Manzel, Martin ; Huber, Stefan ; Bruchlos, Hans ; Bornmann, S. ; Görnert, Peter ; Klinger, Martin ; Stiller, Michael
Author_Institution :
Inst. fur Phys. Hochtechnol., Jena, Germany
fDate :
7/1/1996 12:00:00 AM
Abstract :
We used a sapphire dielectric resonator with a copper cylindrical shield and two endplates replaced by HTS layers for very accurate surface resistance measurements of TBCCO films made by the two step method. This technique allows for the preparation of high quality 2-in diameter Tl-2223 superconducting films with surface resistance values (R s) smaller than 100 μΩ at 5.6 GHz and 77 K. The use of these films in sapphire dielectric resonators yields resonators for the C-band with very high unloaded quality factors (Qo>2×106 at 77 K). Such high Qo -values are not reached with any conventional resonators of comparable size
Keywords :
Q-factor; dielectric resonators; electromagnetic shielding; electron device manufacture; high-temperature superconductors; sapphire; sputter deposition; sputtered coatings; superconducting microwave devices; superconducting thin films; 5.6 GHz; 77 K; Al2O3; C-band; Cu; Cu cylindrical shield; HTS layers; SHF-region; TBCCO-films; TlBaCaCuO; high Q-value resonators; quality factors; sapphire dielectric resonator; superconducting films; surface resistance; Atomic force microscopy; Dielectrics; Electrical resistance measurement; High temperature superconductors; Q factor; Scanning electron microscopy; Superconducting films; Superconducting microwave devices; Surface morphology; Surface resistance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
