Title :
Pulsed laser-induced damage to thin-film optical coatings - Part I: Experimental
Author :
Walker, Thomas W. ; Guenther, Arthur H. ; Nielsen, Philip E.
Author_Institution :
Air Force Weapons Laboratory, Kirtland Air Force Base, NM, USA
fDate :
10/1/1981 12:00:00 AM
Abstract :
We report a parameteric investigation of the damage threshold and morphology of nine frequently employed dielectric coatings as a function of pulse length (5 and 15 ns), frequency (1.06, 0.53, 0.35, and 0.26 μm), and film thickness. A vidicon camera and computer were used to obtain real-time laser spatial profiles for each testing event. This technique greatly reduced the time required to obtain damage thresholds and enabled a large matrix of data to be obtained. The data and damage morphologies are discussed and several important conclusions are drawn concerning pulsed laser-induced damage to optical materials in thin-film form.
Keywords :
Coatings; Dielectric films; Dielectric radiation effects; Laser radiation effects; Optical materials/devices; Pulsed lasers; Coatings; Conducting materials; Electrons; Ionization; Laser fusion; Laser theory; Optical films; Optical materials; Optical pulses; Plasma materials processing;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070662