DocumentCode :
1083595
Title :
Magnetic transistor behavior explained by modulation of emitter injection, not carrier deflection
Author :
Vinal, A.W. ; Masnari, N.A.
Author_Institution :
IBM Corporation, Research Triangle Park, NC
Volume :
3
Issue :
8
fYear :
1982
fDate :
8/1/1982 12:00:00 AM
Firstpage :
203
Lastpage :
205
Abstract :
Novel dual-base, dual-collector, lateral transistors operating in the presence of dc and ac magnetic fields, demonstrate that the differential current at the collector is the result of emitter injection modulation and not carrier deflection. An understanding of basic operating principles has resulted in the design of optimized lateral- and vertical-injecting transitor configurations. The latter exhibit voltage sensitivities exceeding 20 V/T for NPN silicon, at room temperature, and a signal-to-noise ratio of 105for a 1 T magnetic field. A frequency response in excess of 50 MHz should be possible for load resistances less than 1000 ohms.
Keywords :
Bipolar transistors; Design optimization; Helium; Magnetic devices; Magnetic fields; Magnetic modulators; Signal to noise ratio; Silicon; Temperature sensors; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1982.25551
Filename :
1482656
Link To Document :
بازگشت