DocumentCode :
108361
Title :
Analytical Approach to Design of Proportional-to-the-Absolute-Temperature Current Sources and Temperature Sensors Based on Heterojunction Bipolar Transistors
Author :
Golovins, E. ; Sinha, S.
Author_Institution :
Dept. of Electr., Electron. & Comput. Eng., Univ. of Pretoria, Pretoria, South Africa
Volume :
3
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
262
Lastpage :
274
Abstract :
Embedded temperature sensors based on proportional-to-the-absolute-temperature (PTAT) current sources have the potential to lay the foundation for low-cost temperature-aware integrated circuit architectures if they meet the requirements of miniaturization, fabrication process match, and precise estimation in a wide range of temperatures. This paper addresses an analytical approach to the minimum-element PTAT circuit design capitalizing on the physics-based modeling of the heterojunction bipolar transistor (HBT) structures. It is shown that a PTAT circuit can be implemented on only two core HBT elements with good accuracy. Derived parametric relations allow a straightforward specification of the thermal gain at the design stage, which affects sensor sensitivity. Further derived current-to-temperature mapping expresses a temperature estimate based on the measured PTAT output current. Numerical examples indicate attainable estimation accuracy of 0.43% in case of a measurement instance taken in the absence of measurement noise.
Keywords :
constant current sources; heterojunction bipolar transistors; integrated circuit design; temperature sensors; HBT structures; PTAT current sources; current-to-temperature mapping; design stage; embedded temperature sensors; fabrication process match; heterojunction bipolar transistor structures; low-cost temperature-aware integrated circuit architectures; measurement noise; minimum-element PTAT circuit design; physics-based modeling; precise estimation; proportional-to-the-absolute-temperature current sources; sensor sensitivity; temperature estimation; thermal gain; Heterojunction bipolar transistors; Integrated circuit modeling; Temperature distribution; Temperature measurement; Temperature sensors; Bi-complementary metal–oxide–semiconductor (BiCMOS) integrated circuits; bipolar transistors; heterojunction; temperature measurement;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2012.2226886
Filename :
6397587
Link To Document :
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