DocumentCode :
1083818
Title :
Photon induced noise in the SIS detector
Author :
Dubash, Noshir B. ; Pance, Gordana ; Wengler, Michael J.
Author_Institution :
Dept. of Electr. Eng., Rochester Univ., NY, USA
Volume :
42
Issue :
4
fYear :
1994
fDate :
4/1/1994 12:00:00 AM
Firstpage :
715
Lastpage :
725
Abstract :
The dominant source of noise in an SIS mixer is the noise in the photon-induced current. We have made accurate measurements of noise induced in SIS junctions by 95 GHz photons. The noise is measured at 1.5 GHz using a low-noise cryogenic measurement system. The measured photon-induced noise is compared to the noise predicted by Tucker´s theory augmented by a vacuum/thermal noise term. For small to moderate rf powers, at which SIS mixers are operated, the measured noise is nearly perfectly predicted by this theory for all the devices measured. Measurements of series arrays of SIS junctions also agree with this theory showing that the noise of each SIS junction in the array is independent. At large rf powers, the measured noise was higher than the predicted noise, in devices with smaller capacitance. We also measured the noise in single junctions and arrays with no rf radiation. These measurements agreed very well with the predicted shot noise for most bias conditions
Keywords :
electron device noise; microwave detectors; mixers (circuits); random noise; superconducting junction devices; 1.5 GHz; 95 GHz; 95 GHz photons; SIS detector; SIS junction series arrays; SIS mixer; Tucker´s theory; accurate measurements; bias conditions; dominant noise source; low-noise cryogenic measurement system; measured noise; measured photon-induced noise; photon induced noise; photon-induced current; predicted noise; rf powers; shot noise; smaller capacitance; vacuum/thermal noise term; Acoustic reflection; Capacitance measurement; Cryogenics; Detectors; Gain measurement; Noise measurement; Power measurement; Superconducting device noise; Switches; Temperature;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.285086
Filename :
285086
Link To Document :
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