DocumentCode
1083898
Title
Linear CCD-Imagers with a polyimide insulation for double level metallization
Author
Theuwissen, A.J.P. ; Declerck, G.J.
Author_Institution
Catholic University Leuven, Heverlee, Belgium
Volume
3
Issue
10
fYear
1982
fDate
10/1/1982 12:00:00 AM
Firstpage
308
Lastpage
309
Abstract
CCD-imagers have been fabricated with a double metallization and with polyimide (PI) as insulating layer between the two metals. The incorporation of PI reduces the complexity of the CCD-technology without changing the electrical and the optical properties of the imaging devices. In addition, the sensor uniformity is strongly improved due to the enhanced surface flatness.
Keywords
Aluminum; Atmosphere; Insulation; Metallization; Optical sensors; Plasma temperature; Polyimides; Surface topography; Threshold voltage; Wet etching;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1982.25579
Filename
1482684
Link To Document