DocumentCode
1083969
Title
Discrimination of shot-noise-driven poisson processes by external dead time: Application to radioluminescence from glass
Author
Saleh, Bahaa E. ; Tavolacci, Joseph T. ; Teich, Malvin Carl
Author_Institution
Wisconsin Univ., Madison, WI, USA
Volume
17
Issue
12
fYear
1981
fDate
12/1/1981 12:00:00 AM
Firstpage
2341
Lastpage
2350
Abstract
The authors describe ways in which dead time can be used to constructively enhance or diminish the effects of point processes that display bunching, according to whether they are signal or noise and demonstrate that the dead-time-modified count mean and variance for an arbitrary doubly stochastic Poisson point process (DSPP) can be obtained from the Laplace transform of the single-fold and joint moment-generating functions for the driving rate process. The dead time is assumed to be small in comparison with the correlation time of the driving process. The theoretical counting efficiency εm and normalized variance εν for shot-noise light with a rectangular impulse response function are shown to depend principally on the dead-time parameter and on the number of primary events in a correlation time of the driving rate process. The theory is in good accord with the experimental values of these quantities for radioluminescence radiation in three transparent materials (fused silica, quartz and glass).
Keywords
glass; luminescence of inorganic solids; photon counting; random noise; stochastic processes; DSPP; Laplace transform; arbitrary doubly stochastic Poisson point process; bunching; correlation time; count mean; driving rate process; external dead time; fused silica; glass; joint moment-generating functions; noise; normalized variance; point processes; primary events; quartz; radioluminescence; rectangular impulse response function; shot-noise light; shot-noise-driven Poisson processes; signal; single field generating functions; theoretical counting efficiency; variance; Displays; Glass; Laboratories; Laplace equations; Luminescence; Nonlinear filters; Signal processing; Silicon compounds; Statistics; Stochastic resonance;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1981.1070714
Filename
1070714
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