• DocumentCode
    1084020
  • Title

    Fowler-Nordheim emission from non-planar surfaces

  • Author

    Ellis, R.K.

  • Author_Institution
    Xicor, Inc., Milpitas, CA
  • Volume
    3
  • Issue
    11
  • fYear
    1982
  • fDate
    11/1/1982 12:00:00 AM
  • Firstpage
    330
  • Lastpage
    332
  • Abstract
    A mathematically closed form expression for the electric field between arbitrarily shaped surfaces is derived utilizing the techniques of differential geometry. This solution is then applied to the problem of Fowler-Nordheim emission from non-planar surfaces. Knowledge of the field everywhere on the emitting surface allows calculation of the current emitted. A comparison of these calculated values, with measurements made on textured polysilicon emission test structures, is made. The agreement is within 10% across eight orders of magnitude in current. The topological features of the emitting surface predicted by the computations are in agreement with those observed in scanning electron micrographs (SEM´s).
  • Keywords
    Dielectric measurements; Electron devices; Electron emission; Electron traps; Nonvolatile memory; Silicon compounds; Surface fitting; Testing; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1982.25590
  • Filename
    1482695