DocumentCode :
1084020
Title :
Fowler-Nordheim emission from non-planar surfaces
Author :
Ellis, R.K.
Author_Institution :
Xicor, Inc., Milpitas, CA
Volume :
3
Issue :
11
fYear :
1982
fDate :
11/1/1982 12:00:00 AM
Firstpage :
330
Lastpage :
332
Abstract :
A mathematically closed form expression for the electric field between arbitrarily shaped surfaces is derived utilizing the techniques of differential geometry. This solution is then applied to the problem of Fowler-Nordheim emission from non-planar surfaces. Knowledge of the field everywhere on the emitting surface allows calculation of the current emitted. A comparison of these calculated values, with measurements made on textured polysilicon emission test structures, is made. The agreement is within 10% across eight orders of magnitude in current. The topological features of the emitting surface predicted by the computations are in agreement with those observed in scanning electron micrographs (SEM´s).
Keywords :
Dielectric measurements; Electron devices; Electron emission; Electron traps; Nonvolatile memory; Silicon compounds; Surface fitting; Testing; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1982.25590
Filename :
1482695
Link To Document :
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