• DocumentCode
    108403
  • Title

    Highly Elastic Gold Passivated Mechanically Flexible Interconnects

  • Author

    Chaoqi Zhang ; Hyung Suk Yang ; Bakir, Muhannad S.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    3
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    1632
  • Lastpage
    1639
  • Abstract
    A wafer-level batch fabricated mechanically flexible interconnect (MFI) technology with 65- μm vertical elastic range of motion is experimentally demonstrated. A metal alloy (NiW) with ultrahigh yield strength and enhanced geometrical design is adopted to enable elastic deformation over the entire vertical range of motion. The enhanced geometrical design of the MFIs ensures that the stress is distributed uniformly during deformation, and simultaneously maintains an inner stress that is lower than the yield strength of NiW during vertical deformation. In addition, the MFIs are passivated with gold, which is experimentally verified to not only lower the electrical resistance, but also significantly extends the lifetime of the MFIs as it eliminates oxidation of NiW. For 10- μm-thick Au-NiW MFIs, the contact force is up to 10 mN at 50- μm elastic vertical deformation (i.e., compliance of 5 mm/N).
  • Keywords
    elastic deformation; electrical resistivity; flexible electronics; gold; integrated circuit interconnections; nickel alloys; passivation; tungsten alloys; wafer level packaging; yield strength; Au-NiW; NiW metal alloy; contact force; elastic deformation; elastic gold passivation layer; elastic vertical deformation; electrical resistance; geometrical design; mechanically flexible interconnect technology; size 10 mum; size 65 mum; stress distribution; wafer-level; yield strength; Force; Gold; Passivation; Polymers; Silicon; Strain; Stress; CMOS/MEMS integration; NiW; flexible interconnects; gold passivation layer; packaging;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2276436
  • Filename
    6588610