Title :
Electric field distributions in planar transferred-electron devices measured with picosecond optical pulses
Author :
Carruthers, T.F. ; Weller, J.F. ; Binari, S.C. ; Thompson, P.E.
Author_Institution :
Naval Research Laboratory, Washington, DC
fDate :
11/1/1982 12:00:00 AM
Abstract :
The internal static electric field distribution in InP planar transferred-electron devices at subthreshold biases has been measured with a spatial resolution of 1.5 µm by observing the photoconductive current response to picosecond optical pulses. The technique is extremely sensitive to fields in the vicinity of electron velocity saturation values.
Keywords :
Cathodes; Electric variables measurement; Indium phosphide; Optical beams; Optical pulse generation; Optical pulses; Photoconductivity; Plasma measurements; Probes; Pulse measurements;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1982.25596
