DocumentCode :
1084152
Title :
Probabilistic crosstalk delay estimation for ASICs
Author :
Takeuchi, Kan ; Yanagisawa, Kazumasa ; Sato, Takashi ; Sakamoto, Kazuko ; Hojo, Saburo
Author_Institution :
Renesas Technol. Corp., Tokyo, Japan
Volume :
23
Issue :
9
fYear :
2004
Firstpage :
1377
Lastpage :
1383
Abstract :
The crosstalk delay caused by capacitive coupling between wires on a chip is investigated by using a statistical approach and circuit simulations. Two metrics are introduced in order to evaluate an impact of the crosstalk delay on timing design in advance. The first is probabilistic coupling rate (CPR), which can be obtained by the short segment model of the aggressors. Then, the CPR roughly obeys normal distribution and its standard deviation is determined by the slew time of the victim along with the number of aggressor segments. The second is crosstalk delay normalized by the original delay without crosstalk, Δtpd/tpd. The Δtpd/tpd is equal to 2*CPR at the maximum, and CPR on average, regardless of victim length. The two metrics in conjunction with empirical slew distribution allows us to set the appropriate crosstalk delay budget, at the prelayout stage, for reducing the possibility of the crosstalk violation found in the postlayout verification process.
Keywords :
application specific integrated circuits; circuit simulation; crosstalk; delays; integrated circuit design; probability; ASIC; aggressor segments; capacitive coupling; circuit simulations; crosstalk delay estimation; normal distribution; postlayout verification process; probabilistic coupling rate; probabilistic estimation; short segment model; slew distribution; slew time; standard deviation; timing design; Application specific integrated circuits; Circuit simulation; Coupling circuits; Crosstalk; Delay effects; Delay estimation; Gaussian distribution; Large scale integration; Timing; Wires; Crosstalk delay; probabilistic estimation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2004.833605
Filename :
1327678
Link To Document :
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