• DocumentCode
    1084233
  • Title

    A simple formula for the estimation of the capacitance of two-dimensional interconnects in VLSI circuits

  • Author

    Yuan, C.P. ; Trick, T.N.

  • Author_Institution
    University of Illinois, Urbana, IL
  • Volume
    3
  • Issue
    12
  • fYear
    1982
  • fDate
    12/1/1982 12:00:00 AM
  • Firstpage
    391
  • Lastpage
    393
  • Abstract
    A simple formula for the estimation of the capacitance of a single interconnection line in VLSI circuits is presented. It is shown that the approximation agrees favorably with the results obtained from much more costly two-dimensional simulations. The approximation is also simpler and more accurate than other approximations that have been proposed.
  • Keywords
    Capacitance; Circuit simulation; Conductors; Delay; Finite difference methods; Integrated circuit interconnections; MOSFET circuits; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1982.25610
  • Filename
    1482715