Title :
A simple formula for the estimation of the capacitance of two-dimensional interconnects in VLSI circuits
Author :
Yuan, C.P. ; Trick, T.N.
Author_Institution :
University of Illinois, Urbana, IL
fDate :
12/1/1982 12:00:00 AM
Abstract :
A simple formula for the estimation of the capacitance of a single interconnection line in VLSI circuits is presented. It is shown that the approximation agrees favorably with the results obtained from much more costly two-dimensional simulations. The approximation is also simpler and more accurate than other approximations that have been proposed.
Keywords :
Capacitance; Circuit simulation; Conductors; Delay; Finite difference methods; Integrated circuit interconnections; MOSFET circuits; Very large scale integration;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1982.25610
