Title :
Application of IR diode lasers to trace water vapor measurements in microvolume samples
Author :
Mucha, J. ; Bossard, P.
Author_Institution :
Bell Lab., Murray Hill, NJ, USA
fDate :
12/1/1981 12:00:00 AM
Keywords :
Coatings; Diode lasers; Focusing; Optical films; Optical interferometry; Optical recording; Optical surface waves; Temperature; Testing; Thickness measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070775
