Title :
Single-layer gradient-index AR films deposited by the sol-gel process
Author :
Mukherjee, Sayan ; Lowdermilk, W.
Author_Institution :
Battelle Columbus Lab., Columbus, Ohio, USA
fDate :
12/1/1981 12:00:00 AM
Keywords :
Coatings; Focusing; Optical films; Optical interferometry; Optical recording; Optical surface waves; Surface emitting lasers; Temperature; Testing; Thickness measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070776
