Title :
Single-Switch DC–DC Converter With Fault-Tolerant Capability Under Open- and Short-Circuit Switch Failures
Author :
Jamshidpour, Ehsan ; Poure, Philippe ; Gholipour, Eskandar ; Saadate, Shahrokh
Author_Institution :
Fac. des Sci. et Technol., Univ. de Lorraine, Vandoeuvre-les-Nancy, France
Abstract :
This paper proposes fault-tolerant (FT) operation of a single-switch dc-dc converter under a switch failure. In order to improve the reliability in critical applications, FT operation is mandatory to guarantee service continuity. The FT operation of a power system can be performed in three steps: fault diagnosis (detection and identification) and remedial actions. In the case of a switch failure, suitable fault detection is essential to avoid its propagation to the whole system. This study is based on a fast and efficient open- and short-circuit switch fault diagnosis. Both types of switch failure can be detected, identified, and handled in real time by implementing fault diagnosis and reconfiguration strategies on a field-programmable gate array target. No additional sensor is required to perform the fault detection. A redundant switch and a bidirectional switch are needed for converter reconfiguration in postfault operation. The results of hardware-in-the-loop and experimental tests, which all confirm the good performances of the proposed approach, are presented and discussed.
Keywords :
DC-DC power convertors; failure analysis; fault diagnosis; fault tolerance; field programmable gate arrays; redundancy; switching convertors; bidirectional switch reliability; fault detection; fault diagnosis; fault identification; fault tolerant capability; field-programmable gate array; hardware-in-the-loop; open-circuit switch failure; postfault operation; power system FT operation; redundant switch; remedial action; short-circuit switch failure; single-switch DC-DC converter reconfiguration; Circuit faults; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; Inductors; Switches; DC???DC converter; diagnosis; fault tolerance; hardware-in-the-loop (HIL); switch failure;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2014.2342878