• DocumentCode
    1084677
  • Title

    Optical wavefront measurement and/or modification using integrated optics

  • Author

    Rediker, R.H. ; Lind, T.A. ; Burke, B.E.

  • Author_Institution
    Lincoln Lab., MIT, Lexington, MA, USA
  • Volume
    6
  • Issue
    6
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    916
  • Lastpage
    932
  • Abstract
    Sensors consisting of an array of interferometers to measure phase differences and straight waveguides to measure intensity along an optical wavefront have been fabricated in LiNbO3 at four wavelengths, λ=0.458, 0.514, 0.82, and 3.39 μm, and the performance of the sensors has been evaluated. The outputs of the arrays are coupled to an imaging CCD and fed into a computer. Calculations are presented for a conceptual design of a scanning one-dimensional array producing a 50×50 pixel snapshot. Experimental results are presented for 20-resolution-element one-dimensional interferometer arrays at 0.514, 0.82, and 3.39 μm. The results indicate that accurate modification of wavefronts as well as measurements of wavefronts are possible. Two structures for modification of optical wavefronts are proposed
  • Keywords
    integrated optics; light interferometers; optical variables measurement; 0.458 micron; 0.514 micron; 0.82 micron; 3.39 micron; 50×50 pixel snapshot; LiNbO3; computer; imaging CCD; integrated optics; intensity; interferometers; optical wavefront; phase differences; resolution element; straight waveguides; Integrated optics; Interferometers; Optical arrays; Optical interferometry; Optical sensors; Optical waveguides; Phase measurement; Phased arrays; Sensor arrays; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.4083
  • Filename
    4083