Title :
Optical wavefront measurement and/or modification using integrated optics
Author :
Rediker, R.H. ; Lind, T.A. ; Burke, B.E.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
fDate :
6/1/1988 12:00:00 AM
Abstract :
Sensors consisting of an array of interferometers to measure phase differences and straight waveguides to measure intensity along an optical wavefront have been fabricated in LiNbO3 at four wavelengths, λ=0.458, 0.514, 0.82, and 3.39 μm, and the performance of the sensors has been evaluated. The outputs of the arrays are coupled to an imaging CCD and fed into a computer. Calculations are presented for a conceptual design of a scanning one-dimensional array producing a 50×50 pixel snapshot. Experimental results are presented for 20-resolution-element one-dimensional interferometer arrays at 0.514, 0.82, and 3.39 μm. The results indicate that accurate modification of wavefronts as well as measurements of wavefronts are possible. Two structures for modification of optical wavefronts are proposed
Keywords :
integrated optics; light interferometers; optical variables measurement; 0.458 micron; 0.514 micron; 0.82 micron; 3.39 micron; 50×50 pixel snapshot; LiNbO3; computer; imaging CCD; integrated optics; intensity; interferometers; optical wavefront; phase differences; resolution element; straight waveguides; Integrated optics; Interferometers; Optical arrays; Optical interferometry; Optical sensors; Optical waveguides; Phase measurement; Phased arrays; Sensor arrays; Wavelength measurement;
Journal_Title :
Lightwave Technology, Journal of