• DocumentCode
    1084708
  • Title

    Computer simulation of negative-differential-conductivity effects, including trapping

  • Author

    Torrens, Alain B.

  • Author_Institution
    Royal Military College of Canada, Kingston, Ont., Canada
  • Volume
    30
  • Issue
    2
  • fYear
    1983
  • fDate
    2/1/1983 12:00:00 AM
  • Firstpage
    160
  • Lastpage
    170
  • Abstract
    The computer model is based on a simple approximation of GaAs, and provides for the existence of trapping. The relation between voltage, field, and diode length takes into account the internal voltage, due to doping non-uniformities. The simulation is performed without restrictive assumptions on the field or carrier concentrations at the electrodes. Simulation results focus on parastable diodes, which are stable above threshold because the doping concentration N exceeds some critical value Npwhich depends on the electron diffusion D , velocity v , and differential mobility µ δ, in accordance with the small-signal analytical value N_{p} = -\\epsilon v^{2}/4De \\mu \\delta . As N increases, the field EUin the uniform region of a parastable diode decreases, making parastability less sensitive to doping inhomogeneities. A positive doping gradient near the anode: 1) can make a diode unstable near threshold, and parastable at higher voltages; and 2) causes static negative differential resistance. The ac conductance of a para-stable diode become negative at sufficient modulating voltage levels in the microwave range. The diode can operate in the LSA mode, yet return to parastability when the modulating voltage is removed.
  • Keywords
    Analytical models; Computational modeling; Computer simulation; Diodes; Doping; Electrodes; Electron mobility; Gallium arsenide; Semiconductor process modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1983.21090
  • Filename
    1482991