Title :
Measurement of series resistance in IMPATT diodes
Author :
Adlerstein, Michael G. ; Holway, Lowell H., Jr. ; Chu, Shiou Lung G
Author_Institution :
Raytheon Research Division, Lexington, MA
fDate :
2/1/1983 12:00:00 AM
Abstract :
A new method is given for determining the electrical series resistance of an IMPATT diode. The measurement is based on observation of the oscillation threshold bias current for a diode in a standard circuit. The method is applied to GaAs diodes near 40 GHz. The values obtained are used to quantitatively explain other performance characteristics of the diodes.
Keywords :
Circuits; Current measurement; Diodes; Electric resistance; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Gallium arsenide; Power measurement; Radio frequency;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21092
