Title :
Optical information processing using integrated-optic devices
Author_Institution :
University of California, Irvine, CA, USA
fDate :
12/1/1981 12:00:00 AM
Keywords :
Coatings; Information processing; Integrated optics; Optical devices; Optical films; Optical interferometry; Optical recording; Optical surface waves; Testing; Thickness measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070793
