DocumentCode
1084862
Title
SP: an advanced surface-potential-based compact MOSFET model
Author
Gildenblat, Gennady ; Wang, Hailing ; Chen, Ten-Lon ; Gu, Xin ; Cai, Xiaowen
Author_Institution
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
Volume
39
Issue
9
fYear
2004
Firstpage
1394
Lastpage
1406
Abstract
This work describes an advanced physics-based compact MOSFET model (SP). Both the quasistatic and nonquasi-static versions of SP are surface-potential-based. The model is symmetric, includes the accumulation region, small-geometry effects, and has a consistent current and charge formulation. The surface potential is computed analytically and there are no iterative loops anywhere in the model. Availability of the surface potential in the source-drain overlap regions enables a physics-based formulation of the extrinsic model (e.g., gate tunneling current) and allows for a noise model free of discontinuities or unphysical interpolation schemes. Simulation results are used to illustrate the interplay between the model structure and circuit design.
Keywords
MOSFET; semiconductor device models; surface potential; MOSFET model; accumulation region; charge formulation; current formulation; gate tunneling current; iterative loops; physics-based formulation; small-geometry effects; source-drain overlap regions; surface potential; Analog circuits; Circuit noise; Circuit simulation; Circuit synthesis; Computational modeling; Interpolation; MOSFET circuits; Physics; Threshold voltage; Tunneling; Compact model; MOSFET; surface potential;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2004.831604
Filename
1327736
Link To Document