Title :
Spectral-domain analysis of microstrip transmission line covered with lossy dielectric
Author :
Keam, R.B. ; Holmes, W.S.
Author_Institution :
Ind. Res. Ltd., Microwave Eng., Auckland, New Zealand
fDate :
8/3/1995 12:00:00 AM
Abstract :
Microstrip transmission lines show many properties which make them suitable as a medium for contact measurement of complex dielectric permittivity. Such a system could be based on determining the effective permittivity of a microstrip line covered by an unknown dielectric substance. To achieve this an analysis of a microstrip transmission line covered with a lossy dielectric is presented which is based on the well known spectral domain Galerkin method. A comparison of the analysis with experimental measurements is presented, which shows that the theory is accurate for a range of material permittivities
Keywords :
Galerkin method; microstrip lines; spectral-domain analysis; transmission line theory; Galerkin method; lossy dielectric; material permittivities; microstrip transmission line; spectral-domain analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19950925