Title :
Total internal reflection deflector
Author_Institution :
Xerox EOS, Pasadena, CA, USA
fDate :
12/1/1981 12:00:00 AM
Keywords :
Apertures; Electrodes; Electron optics; Electrooptical waveguides; Optical distortion; Optical films; Optical reflection; Optical waveguides; Photoconducting materials; Voltage;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070803
