DocumentCode
1084967
Title
High brightness GaP green LED´s
Author
Niina, Tatsuhiko ; Yamaguchi, Takao ; Yamazawa, Tadanobu ; Ishii, Toshihiko ; Takasu, Hiromi ; Inoue, Kentaro
Author_Institution
Sanyo Electric Company, Ltd., Osaka, Japan
Volume
30
Issue
4
fYear
1983
fDate
4/1/1983 12:00:00 AM
Firstpage
264
Lastpage
267
Abstract
High brightness GaP green LED´s have been developed by optimizing growth conditions to obtain a high quality p-n junction. In particular, the n-type GaP layer near the junction is greatly lowered in carrier concentration in order to decrease the nonradiative recombination center. The carrier concentration in the n-type GaP layer is decreased to 5-6 × 1015/cm3near the p-n junction and a minority-carrier lifetime of 800 ns (measured through the EL decay time) is obtained. The best device has a quantum efficiency of 0.45 percent at 12.5 A/cm^{2} with encapsulation. Excellent high-brightness LED lamps of 400 m Cd at a driving current of 20 mA can be obtained by using the high efficiency GaP green LED´s.
Keywords
Brightness; Doping; Encapsulation; Furnaces; Helium; LED lamps; Light emitting diodes; P-n junctions; Substrates; Time measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1983.21114
Filename
1483015
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