Title :
Optical testing of computer circuitry
Author_Institution :
IBM Corp., Endicott, NY, USA
fDate :
12/1/1981 12:00:00 AM
Keywords :
Cameras; Circuit testing; Copper; Optical computing; Optical materials; Optical sensors; Reflectivity; Software testing; System testing; Velocity measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070814
