DocumentCode :
1085058
Title :
Proximity communication
Author :
Drost, Robert J. ; Hopkins, Robert David ; Ho, Ron ; Sutherland, Ivan E.
Author_Institution :
Sun Microsystems Res. Labs., Mountain View, CA, USA
Volume :
39
Issue :
9
fYear :
2004
Firstpage :
1529
Lastpage :
1535
Abstract :
This paper reports results from wireless chip-to-chip communication experiments. Sixteen bit words pass from one chip to another in parallel without detectable error at 1.35 billion data items per second for a total data rate of 21.6 Gigabits per second. The experiment transmits pseudo random patterns between chips built in a 350-nm CMOS technology. Chips touch face-to-face to communicate. The same pseudorandom data pattern is loaded onto both chips so that the receiving chip can check the accuracy of every bit communicated. Each communication channel consumes a static power of 3.6 mW, and a dynamic power of 3.9 pJ per bit communicated. The channels lie on 50-μm centers. Because the capacitive communication works through covering oxide, ESD protection is unnecessary. Vernier position measuring circuits built into the chips indicate the relative position of transmitting and receiving arrays to assist mechanical alignment. The test chip includes a Vernier measurement circuit that provides inter-chip position measurements with a resolution of 1.4 μm.
Keywords :
CMOS integrated circuits; electrostatic discharge; system-on-chip; 3.6 mW; 350 nm; CMOS integrated circuit; CMOS technology; ESD protection; Vernier position measuring circuit; bandlimited communication; capacitive communication; capacitively coupled communication; chip-to-chip communication; data communication; mechanical alignment measurement; proximity communication; wireless communication; CMOS technology; Circuit testing; Communication channels; Electrostatic discharge; Face detection; Mechanical variables measurement; Position measurement; Protection; Semiconductor device measurement; Wireless communication; Bandlimited communication; CMOS integrated circuit; Proximity Communication; Vernier measurement; capacitively coupled communication; chip-to-chip communication; data communication; mechanical alignment measurement;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.831448
Filename :
1327751
Link To Document :
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