• DocumentCode
    1085215
  • Title

    High transconductance normally-off GaN MODFETs

  • Author

    Özgür, A. ; Kim, W. ; Fan, Z. ; Botchkarev, A. ; Salvador, A. ; Mohammad, S.N. ; Sverdlov, B. ; Morkoc, H.

  • Author_Institution
    Mater. Res. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    31
  • Issue
    16
  • fYear
    1995
  • fDate
    8/3/1995 12:00:00 AM
  • Firstpage
    1389
  • Lastpage
    1390
  • Abstract
    Normally-off GaN based modulation doped field-effect transistors have been fabricated. The extrinsic transconductance of MODFETs with gate and channel lengths of 3 and 5 μm, respectively, is as high as 120 mS/mm. The devices exhibit 300 mA/mm current at a positive gate bias of 3 V. This transconductance value compares very favourably with the 45 mS/mm and 24 mS/mm reported earlier for 1 and 0.23 μm gate devices, respectively
  • Keywords
    III-V semiconductors; gallium compounds; high electron mobility transistors; 120 mS/mm; 3 V; 3 micron; 5 micron; GaN; MODFETs; field-effect transistors; high extrinsic transconductance; modulation doped FET; normallyoff devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950921
  • Filename
    408345