Title :
Synthetic Environments for Simulated Missions
Author :
Gaskell, Robert ; Husman, Laura Ekroot ; Collier, James B. ; Chen, Richard L.
Author_Institution :
California Inst. of Technol., Pasadena
fDate :
7/1/2007 12:00:00 AM
Abstract :
Synthetic environments offer Space Flight projects an opportunity to perform rapid, comprehensive, and rigorous modeling of the critical elements of a mission in order to compute quantitative measures of design performance, associated risk, and actual mission utility value. Significantly, these studies can be performed early in the mission cycle. These synthetic terrains are generated on parallel, high-performance computers and served to remote simulations at near-interactive speeds. The terrain creation uses a realistic sequence of physical phenomena such as cratering and dusting with parametric control of features such as surface roughness and rock density. Terrain resolution may be arbitrary but typically ranges from 0.01 to 10 meters. The terrain server has been used for two rover simulations, one using the actual Sojourner autonomy flight code, and the other a more general algorithm. Monte Carlo studies of rover designs interacting with synthetic environments were executed in parallel to quickly compute performance statistics and risk estimates.
Keywords :
Monte Carlo methods; aerospace computing; aerospace simulation; planetary rovers; surface roughness; terrain mapping; Monte Carlo study; Sojourner autonomy flight code; actual mission utility value; associated risk; design performance; high-performance computers; parametric control; performance statistics; realistic sequence; remote simulations; risk estimates; rock density; rover simulations; simulated missions; space flight projects; surface roughness; synthetic environments; synthetic terrains; terrain creation; terrain server; Aerospace simulation; Computational modeling; Computer simulation; Concurrent computing; Extraterrestrial measurements; Monte Carlo methods; Performance evaluation; Rough surfaces; Space missions; Surface roughness;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
DOI :
10.1109/MAES.2007.4285976