DocumentCode :
1085370
Title :
TC-FTC Celebrates Flagship Symposium´s 25th Anniversary
Author :
Arlat, Jean
Volume :
28
Issue :
12
fYear :
1995
Firstpage :
90
Keywords :
Application software; Automatic testing; Computer architecture; Conferences; Fault diagnosis; Fault tolerance; Fault tolerant systems; Silver; Software testing; System testing;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.1995.476208
Filename :
476208
Link To Document :
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