Title :
Reliable SR latches design using local redundancy
Author :
Lin, S.H. ; Yang, H.Z.
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing
Abstract :
By using local redundancy, two improved soft-error-tolerant SR latches are proposed. Experimental results show that the new latches have superior delay performance compared to the traditional ones and can recover from the soft errors caused by cosmic rays and particle strikes
Keywords :
flip-flops; radiation hardening (electronics); SR latches; local redundancy; soft-error-tolerant;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20073262
