DocumentCode :
1085520
Title :
Thermal characterization of a 149-lead VLSI package with heatsink
Author :
Wesling, Paul B.
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
Volume :
11
Issue :
4
fYear :
1988
fDate :
12/1/1988 12:00:00 AM
Firstpage :
512
Lastpage :
515
Abstract :
The steady-state and dynamic thermal characteristics of a 149-lead hermetic PGA (pin-grid array) package are studied, with focus on three different configurations of a stacked-fin heatsink and on two types of fillers for the epoxy heatsink attach adhesive. The package described has high thermal performance in an air-cooled regime. Data are presented showing thermal resistance from junction to ambient as a function of the number of heatsink fins and the composition of the heatsink-attach epoxy. At nominal conditions, thermal resistance from junction to ambient of the selected 5-fin heatsink and aluminium-filled epoxy adhesive is less than 6°C/W at an airflow of 2.5 m/s (500 linear ft/min). Also discussed is the function-to-case thermal resistance, measured per SEMI Standard G30-86. A value of 2.1°C/W was measured for the package
Keywords :
VLSI; heat sinks; packaging; SEMI Standard G30-86; VLSI package; air-cooled regime; airflow; epoxy heatsink attach adhesive; heatsink; hermetic PGA; pin-grid array; stacked-fin heatsink; thermal characteristics; thermal resistance; Aluminum; Ceramics; Electrical resistance measurement; Electronics packaging; Integrated circuit packaging; Resistance heating; Semiconductor device packaging; Sockets; Thermal resistance; Very large scale integration;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.16691
Filename :
16691
Link To Document :
بازگشت