DocumentCode :
1085530
Title :
Statistical analysis of power module thermal test equipment performance
Author :
Houf, Robert E. ; Berman, David B.
Author_Institution :
Allen-Bradley Co. Inc., Milwaukee, WI, USA
Volume :
11
Issue :
4
fYear :
1988
Firstpage :
516
Lastpage :
520
Abstract :
Describe a test methodology for obtaining reliable thermal performance measurements for custom design of moderately-high-power semiconductor modules. The accuracy and repeatability of the instrument system was determined by use of a statistical gauge study. It is shown that the statistical tool is essential in determining the ability of the measurement system to detect and quantify variability in the data due to the parts under test, the test equipment, and operator influences. The proposed method provides a means of demonstrating vendor/supplier test capability which can reduce potential sources of conflict in part acceptance testing.<>
Keywords :
modules; power integrated circuits; statistical analysis; test equipment; conflict; custom design; operator influences; part acceptance testing; parts under test; power module thermal test equipment performance; semiconductor modules; statistical gauge study; test capability; variability; Electrical resistance measurement; Electronic packaging thermal management; Heat sinks; Multichip modules; Resistance heating; Statistical analysis; Test equipment; Testing; Thermal resistance; Thyristors;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.16692
Filename :
16692
Link To Document :
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