Title :
Mo2N/Mo gate MOSFET´s
Author :
Kim, Manjin J. ; Brown, Dale M.
Author_Institution :
General Electric Company, Schenectady, NY
fDate :
6/1/1983 12:00:00 AM
Abstract :
Molybdenum nitride coatings on molybdenum, from a direct reaction of molybdenum with ammonia, are used to improve the gate electrode properties of Mo gate self-aligned MOSFET´s. A Mo2N double-layer gate shows resistance against oxidation and processing reagents, and improved ion-implantation masking. The work function of the double-layer film was determined to be 4.69 ± 0.03 eV, which is independent of the nitride thickness and annealing conditions. The projected range of boron implantation is smaller in Mo2N than in Mo. A Mo2N coating of 870 Å over 2130- Å Mo masks up to 60-keV11B and 120-keV75As. The implantation study covers the energy range from 15 to 70 keV for boron and from 40 to 160 keV for arsenic.
Keywords :
Annealing; Boron; Coatings; Conductivity; Energy measurement; Glass; MOSFET circuits; Power measurement; Temperature; Voltage measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21175