DocumentCode
1085574
Title
Mo2 N/Mo gate MOSFET´s
Author
Kim, Manjin J. ; Brown, Dale M.
Author_Institution
General Electric Company, Schenectady, NY
Volume
30
Issue
6
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
598
Lastpage
602
Abstract
Molybdenum nitride coatings on molybdenum, from a direct reaction of molybdenum with ammonia, are used to improve the gate electrode properties of Mo gate self-aligned MOSFET´s. A Mo2 N double-layer gate shows resistance against oxidation and processing reagents, and improved ion-implantation masking. The work function of the double-layer film was determined to be 4.69 ± 0.03 eV, which is independent of the nitride thickness and annealing conditions. The projected range of boron implantation is smaller in Mo2 N than in Mo. A Mo2 N coating of 870 Å over 2130- Å Mo masks up to 60-keV11B and 120-keV75As. The implantation study covers the energy range from 15 to 70 keV for boron and from 40 to 160 keV for arsenic.
Keywords
Annealing; Boron; Coatings; Conductivity; Energy measurement; Glass; MOSFET circuits; Power measurement; Temperature; Voltage measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1983.21175
Filename
1483076
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