DocumentCode :
1085817
Title :
Submicron-square emitter AlGaAs/GaAs HBTs with AlGaAs hetero-guardring
Author :
Ueda, Y. ; Hayama, N. ; Honjo, K.
Author_Institution :
Microelectron. Res. Lab., NEC Corp., Ibaraki, Japan
Volume :
15
Issue :
2
fYear :
1994
Firstpage :
66
Lastpage :
68
Abstract :
Successful operation of submicron-square emitter AlGaAs/GaAs HBTs is demonstrated for the first time by using a fully mesa-structure-type emitter-base junction-area definition method with an AlGaAs hetero-guardring. The hetero-guardring reduces surface recombination current at the emitter-mesa edge to 1.4 μA/μm. This is 1/10 of that for devices without the guardring. Here, dc gains of 20, 26, and 40 are achieved for 0.5 μm×0.5 μm, 0.7 μm×0.7 μm, and 0.9 μm×0.9 μm emitter HBTs, respectively. An fT of 40 GHz, and an fmax of 30 GHz are obtained for 0.9 μm×0.9 μm at a J/sub C/ of 1.0×105 A/cm2.
Keywords :
III-V semiconductors; aluminium compounds; electron-hole recombination; gallium arsenide; heterojunction bipolar transistors; 30 GHz; 40 GHz; AlGaAs hetero-guardring; AlGaAs-GaAs; dc gains; emitter-mesa edge; mesa-structure-type emitter-base junction-area definition; submicron-square emitter AlGaAs/GaAs HBTs; surface recombination current; Electrodes; Etching; Fabrication; Gallium arsenide; Gold; Heterojunction bipolar transistors; Leakage current; Passivation; Polyimides; Power dissipation;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.285371
Filename :
285371
Link To Document :
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