Title :
An Electrothermally Actuated VO2-Based MEMS Using Self-Sensing Feedback Control
Author :
Merced, Emmanuelle ; Torres, David ; Xiaobo Tan ; Sepulveda, Nelson
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
A self-sensing approach is used to accurately control the large displacements observed in VO2-based microelectromechanical systems actuators. The device is operated electrothermally using integrated resistive heaters. The coupling of the abrupt electrical and mechanical changes in VO2 films across its phase transition allow for the estimation of the device´s deflection by monitoring the film´s resistance. Furthermore, the typical hysteretic behavior observed in VO2 films is significantly reduced in the present device and the need for optical testing equipment is eliminated. The displacement-resistance relationship is modeled by a memoryless Boltzmann function consisting of four parameters, which are optimized to fit the experimental data with an average error of 1.1 μm throughout the complete actuation range of 95 μm. The estimated deflection is used as feedback to achieve closed-loop micropositioning control of the device, which is designed from the system dynamics obtained experimentally. Closed-loop sinusoidal and step reference response experiments are performed in order to show the effectiveness of the self-sensing feedback technique used. In the closed-loop sinusoidal frequency response, a cutoff frequency of 43 Hz is observed with a maximum actual deflection error of 0.19 dB up to the phase margin frequency of 30 Hz. In the step response, an average actual displacement steady-state error of ±1.15 μm is obtained with response times ranging from 5 to 12 ms.
Keywords :
closed loop systems; displacement control; frequency response; microactuators; micropositioning; optical testing; phase transformations; step response; test equipment; vanadium compounds; VO2; closed-loop micropositioning control; closed-loop sinusoidal frequency response; cutoff frequency; device deflection; displacement-resistance relationship; electrothermally actuated-based MEMS; film resistance monitoring; frequency 30 Hz; frequency 43 Hz; hysteretic behavior; integrated resistive heaters; large displacement control; memoryless Boltzmann function; microelectromechanical systems actuators; optical testing equipment; phase transition; self-sensing feedback control; step reference response; system dynamics; time 5 ms to 12 ms; Actuators; Electrical resistance measurement; Heating; Hysteresis; Micromechanical devices; Resistance; Sensors; MEMS actuator; Vanadium dioxide; phase transition; phase transition.; self-sensing feedback;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2014.2317944