Title :
Subclass Problem-Dependent Design for Error-Correcting Output Codes
Author :
Escalera, Sergio ; Tax, David M J ; Pujol, Oriol ; Radeva, Petia ; Duin, Robert P W
Author_Institution :
Comput. Vision Center, Barcelona
fDate :
6/1/2008 12:00:00 AM
Abstract :
A common way to model multiclass classification problems is by means of Error-Correcting Output Codes (ECOCs). Given a multiclass problem, the ECOC technique designs a code word for each class, where each position of the code identifies the membership of the class for a given binary problem. A classification decision is obtained by assigning the label of the class with the closest code. One of the main requirements of the ECOC design is that the base classifier is capable of splitting each subgroup of classes from each binary problem. However, we cannot guarantee that a linear classifier model convex regions. Furthermore, nonlinear classifiers also fail to manage some type of surfaces. In this paper, we present a novel strategy to model multiclass classification problems using subclass information in the ECOC framework. Complex problems are solved by splitting the original set of classes into subclasses and embedding the binary problems in a problem-dependent ECOC design. Experimental results show that the proposed splitting procedure yields a better performance when the class overlap or the distribution of the training objects conceal the decision boundaries for the base classifier. The results are even more significant when one has a sufficiently large training size.
Keywords :
error correction codes; classification decision; error correcting output codes; multiclass classification model; nonlinear classifiers; subclass information; Classifier design and evaluation; Computing Methodologies; Design Methodology; Machine learning; Pattern Recognition; Statistical Models; Algorithms; Artifacts; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2008.38