Title :
Resistivity and mobility of GaP at 300 K
Author :
Kao, Y.C. ; Eknoyan, O.
Author_Institution :
Texas A & M University, College Station, TX
fDate :
7/1/1983 12:00:00 AM
Abstract :
Resistivity and mobility data of GaP at 300 K are presented in a unified form as a function of impurity concentration for the first time. The data are determined from sheet Hall coefficient and resistivity measurements obtained using the van der Pauw method. The results are given over a wide range of concentrations ranging from unitentionally doped to degenerate conditions. The maximum values of the electron and hole mobility, µnand µp, are found to be 160 and 135 cm2/V . s, respectively.
Keywords :
Acoustic scattering; Charge carrier processes; Conductivity; Doping; Epitaxial growth; Impurities; Light scattering; Optical scattering; Pollution measurement; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21221