DocumentCode :
1086137
Title :
Breakdown Phenomena in Nitrogen Due to Repetitive Nanosecond-pulses
Author :
Shao, Tao ; Sun, Guangsheng ; Yan, Ping ; Zhang, Shichang
Author_Institution :
Chinese Acad. of Sci., Beijing
Volume :
14
Issue :
4
fYear :
2007
Firstpage :
813
Lastpage :
819
Abstract :
Nanosecond-pulse breakdown indicates special characteristics depending on the pulse rise-time and duration. Based on a repetitive nanosecond-pulse generator, breakdown phenomena of parallel-plane gaps in nitrogen were investigated with single pulse and repetitive bursts under different gap conditions. The relationships between applied voltage, pulse repetition frequency, breakdown time lag, repetitive pulse stress time and the number of applied pulses are presented. The curves regarding E-field strength, breakdown time lag and gas pressure are also obtained. The experimental results show that breakdown characteristics with repetitive nanosecond-pulses are different from that with single pulse. Repetitive nanosecond-pulse breakdown is concerned with the accumulation effect that is attributed to residual ions and metastable species survived from previous pulses. In addition, a modified empirical formula about E-field strength, breakdown time lag and gas density is given for the breakdown data.
Keywords :
electric breakdown; pulse generators; pulsed power technology; E-field strength; applied voltage; breakdown phenomena; breakdown time lag; gas pressure; metastable species; nitrogen; parallel-plane gaps; pulse duration; pulse repetition frequency; pulse rise-time; repetitive nanosecond-pulses; repetitive pulse stress time; residual ions; Breakdown voltage; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Frequency; Gases; Nitrogen; Power system reliability; Pulse power systems; Space vector pulse width modulation;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2007.4286511
Filename :
4286511
Link To Document :
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