Title :
High-performance back-illuminated InGaAs/InAlAs MSM photodetector with a record responsivity of 0.96 A/W
Author :
Kim, Jae H. ; Griem, H. Torsten ; Friedman, Robert A. ; Chan, Eric Y. ; Ray, Sankar
Author_Institution :
Boeing Defense & Space Group, Seattle, WA, USA
Abstract :
A high-performance back-illuminated In/sub 0.53/Ga/sub 0.47/As/In/sub 0.52/Al/sub 0.48/As/InP metal-semiconductor-metal (MSM) detector is reported. A record responsivity of 0.96 A/W at 1.3- mu m wavelength, corresponding to a quantum efficiency of 92%, was measured at 5 V and showed virtually no internal gain at 20 V. Packaged devices with 150- mu m-diameter large detection area showed a 3-dB bandwidth of 4 GHz at 5 V with fiber pigtail butt-coupled package and 3.5 GHz with fiber pigtail silicon V-grooved package. Switching to front-illumination improves the bandwidth by 30-40% with 45-50% reduction of responsivity. Planar and mesa devices both show a low capacitance per unit area of 3.0 nF/cm/sup 2/ and dark current density of 5.6*10/sup -5/ A/cm/sup 2/ at 5 V. Preliminary reliability test results show that the detector biased at 5 V survived temperature cycling of -35 degrees C to 200 degrees C, high-temperature burn-in at 125 degrees C for 168 h and subsequent short-term accelerated aging at 200 degrees C for 120 h without degradation.<>
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; life testing; metal-semiconductor-metal structures; optical testing; photodetectors; photodiodes; reliability; semiconductor device testing; -35 to 200 degC; 1.3 micron; 120 hrs; 125 degC; 150 micron; 168 hrs; 20 V; 200 degC; 3.5 GHz; 4 GHz; 5 V; 92 percent; IR; InGaAs-InAlAs-InP; MSM photodetector; back-illuminated; dark current density; degradation; fiber pigtail butt-coupled package; fiber pigtail silicon V-grooved package; fibre coupling; front-illumination; high-performance; high-temperature burn-in; internal gain; large detection area; low capacitance; mesa devices; metal-semiconductor-metal; packaged devices; planar devices; quantum efficiency; reliability test; responsivity; semiconductors; short-term accelerated aging; temperature cycling; Area measurement; Bandwidth; Detectors; Gain measurement; Indium compounds; Indium gallium arsenide; Indium phosphide; Optical fiber devices; Packaging; Photodetectors;
Journal_Title :
Photonics Technology Letters, IEEE