DocumentCode :
1086508
Title :
Two-dimensional analysis of semiconductor devices using general-purpose interactive PDE software
Author :
Blue, James L. ; Wilson, Charles L.
Author_Institution :
National Bureau of Standards, Washington, DC
Volume :
30
Issue :
9
fYear :
1983
fDate :
9/1/1983 12:00:00 AM
Firstpage :
1056
Lastpage :
1070
Abstract :
Analyzing currents and fields in VLSI devices requires solving three coupled nonlinear elliptic partial differential equations in two dimensions. Historically, these equations have been solved using a special-purpose program and batch runs on a large fast computer. We use a general-purpose program and interactive runs on a large minicomputer. We discuss the physical formulation of the semiconductor equations and give three example solutions: a short-channel MOSFET near punchthrough, a DMOS power transistor in the ON state, and a beveled p-n junction. These examples demonstrate that solutions to a very general class of semiconductor-device problems can be obtained using these methods.
Keywords :
Couplings; MOSFET circuits; Microcomputers; Nonlinear equations; P-n junctions; Partial differential equations; Power MOSFET; Power transistors; Semiconductor devices; Very large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1983.21260
Filename :
1483161
Link To Document :
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