Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization

Author

Zeng, A. ; Shah, S.A. ; Jackson, M.K.

Author_Institution

Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada

Volume

44

Issue

7

fYear

1996

fDate

7/1/1996 12:00:00 AM

Firstpage

1155

Lastpage

1157

Abstract

We report time-resolved measurements of the invasiveness of LiTaO ₃ external probes in millimeter-wave electrooptic sampling. Using external probe tips at varying distances from a coplanar stripline, we show that invasiveness can be reduced in a noncontact configuration at the expense of measurement sensitivity. In the contact configuration, the risetime can be significantly lengthened by dispersion and signal reflection caused by the probe tip

Keywords

electro-optical devices; integrated circuit measurement; integrated optoelectronics; lithium compounds; millimetre wave integrated circuits; millimetre wave measurement; probes; signal sampling; time resolved spectroscopy; LiTaO₃; contact configuration; coplanar stripline; dispersion; external probes; measurement sensitivity; millimeter-wave electrooptic sampling; millimeter-wave optoelectronic characterization; noncontact configuration; noncontact electrooptic probes; probe tip; signal reflection; time-resolved measurements; Contacts; Electrodes; Millimeter wave measurements; Photoconductivity; Probes; Reflection; Sampling methods; Stripline; Switches; Transmission line measurements;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.508652

Filename

508652