DocumentCode :
1086535
Title :
Numerical solution of the semiconductor transport equations with current boundary conditions
Author :
Grossm, Bertrand M. ; Hargrove, Michael J.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume :
30
Issue :
9
fYear :
1983
fDate :
9/1/1983 12:00:00 AM
Firstpage :
1092
Lastpage :
1096
Abstract :
The semiconductor transport equations are solved by a hybrid finite-element method with current specified as a boundary condition at device contacts. Single carrier or bipolar devices of arbitrary shape, operating under transient or steady-state conditions, can be simulated with current sources or simple circuit elements connected to device terminals. This paper describes the numerical technique and device applications.
Keywords :
Boundary conditions; Charge carrier processes; Circuit simulation; Electron mobility; Finite element methods; Poisson equations; Radiative recombination; Semiconductor impurities; Shape; Spontaneous emission;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1983.21263
Filename :
1483164
Link To Document :
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