Title :
Numerical solution of the semiconductor transport equations with current boundary conditions
Author :
Grossm, Bertrand M. ; Hargrove, Michael J.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
fDate :
9/1/1983 12:00:00 AM
Abstract :
The semiconductor transport equations are solved by a hybrid finite-element method with current specified as a boundary condition at device contacts. Single carrier or bipolar devices of arbitrary shape, operating under transient or steady-state conditions, can be simulated with current sources or simple circuit elements connected to device terminals. This paper describes the numerical technique and device applications.
Keywords :
Boundary conditions; Charge carrier processes; Circuit simulation; Electron mobility; Finite element methods; Poisson equations; Radiative recombination; Semiconductor impurities; Shape; Spontaneous emission;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21263