• DocumentCode
    1086585
  • Title

    Analysis of Integrated Circuit System s by An Innovative Wavelet-Based Scattering Matrix Approach

  • Author

    Barmada, Sami ; Musolino, Antonino ; Raugi, Marco

  • Author_Institution
    Dipt. Sistemi Elettrici e Automazione, Pisa Univ.
  • Volume
    30
  • Issue
    1
  • fYear
    2007
  • Firstpage
    86
  • Lastpage
    96
  • Abstract
    This paper proposes the use of scattering parameters (S-parameters) in the wavelet domain for the analysis of coupled multiconductor transmission lines, high-speed integrated circuits, and interconnects. S-parameters-based computing techniques are widely used in the analysis of networks characterized by a large number of integrated devices and interconnects. The theoretical and practical definition of the wavelet-based S matrix is shown, and then some numerical examples of its use and potential in the analysis of systems with linear and nonlinear terminations is shown and compared with other numerical techniques. The computational costs and the memory requirements of the wavelet representation of scattering matrix are also addressed
  • Keywords
    S-matrix theory; S-parameters; coupled transmission lines; high-speed integrated circuits; integrated circuit interconnections; multiconductor transmission lines; network analysis; wavelet transforms; S-parameters-based computing; high-speed integrated circuits; integrated circuit systems analysis; integrated interconnects; multiconductor transmission lines; network analysis; numerical analysis; scattering parameters; wavelet transforms; wavelet-based scattering matrix; Circuit analysis; Computer networks; Coupling circuits; High speed integrated circuits; Integrated circuit interconnections; Multiconductor transmission lines; Scattering parameters; Transmission line matrix methods; Wavelet analysis; Wavelet domain; Integrated circuits; numerical analysis; scattering parameters; wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2006.890203
  • Filename
    4084581