Title :
Wavelength-dependent marking characteristics of AR tellurium trilayers
Author :
Johnson, Garth ; Ward, Aaron ; Smith, Tim ; Luca, Dumitru
Author_Institution :
Xerox Corp., Webster, NY, USA
fDate :
12/1/1981 12:00:00 AM
Keywords :
Dielectric devices; Dielectric substrates; Interference; Laser feedback; Laser tuning; Optical devices; Optical films; Optical recording; Optical refraction; Tellurium;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1070958
