Title :
Instrumentation notes
Author :
Engelberg, Shlomo ; Frenkel, Haim Yossef ; Haimov, Avraham
Author_Institution :
Jerusalem College of Technology
fDate :
2/1/2009 12:00:00 AM
Abstract :
In this column, we describe what may be the ultimate in do-it-yourself noise measurement tools. We show how you can use noise to make rather detailed measurements of the properties of a passive fi lter and how noise can be used to provide perfect encryption¿at least in principle.
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2009.4762949
