Title :
High-quality 1.3-μm GaInAsP-BH-lasers fabricated by MOVPE and dry-etching technique
Author :
Itoh, Masayuki ; Kondo, Yuta ; Kishi, Kenji ; Yamamoto, Mitsuo ; Itaya, Yoshio
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
Abstract :
High-quality and high-reliability GaInAsP-InP Fabry-Perot-type buried heterostructure strained-multi-quantum-well lasers operating at 1.3 pm have been produced by metalorganic vapor phase epitaxy growth and the dry-etching technique. We compare two types of chemical treatments to slightly etch damaged mesa-walls before regrowth after dry-etching. Slight chemical etching prevents Zn in the p-type buried layer from diffusing to the active layer during regrowth of buried hetero layers. Two step treatment using the combination of selective and unselective wet chemical etching produces a superior mesa-wall which has limited Zn-diffusion to the active layer. BH laser fabricated by MOVPE and the dry-etching technique is also confirmed as having high-reliability in practical usage.
Keywords :
III-V semiconductors; diffusion; etching; gallium arsenide; indium compounds; infrared sources; laser reliability; optical communication equipment; optical fabrication; quantum well lasers; semiconductor device reliability; semiconductor growth; vapour phase epitaxial growth; 1.3 mum; 1.3-/spl mu/m GaInAsP-BH-lasers; GaInAsP-InP; GaInAsP-InP Fabry-Perot-type buried heterostructure strained-multi-quantum-well lasers; MOVPE; Zn; Zn-diffusion; active layer; buried hetero layer regrowth; chemical etching; chemical treatments; dry-etching technique; etch damaged mesa-walls; high-reliability; mesa-wall; metalorganic vapor phase epitaxy growth; selective wet chemical etching produces; unselective wet chemical etching produces; Chemicals; Dry etching; Epitaxial growth; Epitaxial layers; Magnetic confinement; Optical device fabrication; Scanning electron microscopy; Surface treatment; Wet etching; Zinc;
Journal_Title :
Photonics Technology Letters, IEEE