Title :
Accurate wavelength determination in a Wollaston interferometer for sensor applications
Author :
Jiang, X.Q. ; Kemp, J. ; Ning, Y.N. ; Palmer, A.W. ; Grattan, K.T.V.
Author_Institution :
Dept. of Electr. Electron. & Inf. Eng., City Univ., London, UK
Abstract :
A novel wavelength measurement scheme, for practical wavelength-dependent optical sensor applications, configured with the use of an additional known wavelength as a self-reference to achieve high measurement accuracy over a range of tens of nanometers is described and presented.
Keywords :
CCD image sensors; light interferometers; measurement errors; optical polarisers; optical prisms; optical variables measurement; CCD image sensors; Wollaston interferometer; additional known wavelength; high measurement accuracy; self-reference; sensor applications; wavelength determination; wavelength measurement scheme; wavelength-dependent optical sensor applications; Charge coupled devices; Interference; Optical interferometry; Optical modulation; Optical sensors; Optical surface waves; Q measurement; Sensor phenomena and characterization; Spectroscopy; Wavelength measurement;
Journal_Title :
Photonics Technology Letters, IEEE
