• DocumentCode
    108727
  • Title

    Noise-Resistant Local Binary Pattern With an Embedded Error-Correction Mechanism

  • Author

    Jianfeng Ren ; Xudong Jiang ; Junsong Yuan

  • Author_Institution
    BeingThere Centre, Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    22
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    4049
  • Lastpage
    4060
  • Abstract
    Local binary pattern (LBP) is sensitive to noise. Local ternary pattern (LTP) partially solves this problem. Both LBP and LTP, however, treat the corrupted image patterns as they are. In view of this, we propose a noise-resistant LBP (NRLBP) to preserve the image local structures in presence of noise. The small pixel difference is vulnerable to noise. Thus, we encode it as an uncertain state first, and then determine its value based on the other bits of the LBP code. It is widely accepted that most of the image local structures are represented by uniform codes and noise patterns most likely fall into the non-uniform codes. Therefore, we assign the value of an uncertain bit hence as to form possible uniform codes. Thus, we develop an error-correction mechanism to recover the distorted image patterns. In addition, we find that some image patterns such as lines are not captured in uniform codes. Those line patterns may appear less frequently than uniform codes, but they represent a set of important local primitives for pattern recognition. Thus, we propose an extended noise-resistant LBP (ENRLBP) to capture line patterns. The proposed NRLBP and ENRLBP are more resistant to noise compared with LBP, LTP, and many other variants. On various applications, the proposed NRLBP and ENRLBP demonstrate superior performance to LBP/LTP variants.
  • Keywords
    error correction codes; image coding; LBP code; NRLBP; distorted image pattern recovery; embedded error correction mechanism; image local structure preservation; noise resistant LBP; noise resistant local binary pattern; pattern recognition; Local binary pattern; local ternary pattern; noise resistance; uniform patterns;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/TIP.2013.2268976
  • Filename
    6542010