Title :
Selective low-pressure silicon epitaxy for MOS and bipolar transistor application
Author :
Kürten, Hans ; Voss, Heinz-Jürgen ; Kim, Wonchan ; Engl, Walter L.
Author_Institution :
Technische Hochschule Aachen, Aachen, Germany
fDate :
11/1/1983 12:00:00 AM
Abstract :
The selective low-pressure epitaxy is presented in this paper. In contrast to LOCOS technology, this process starts with structuring a thick field oxide by anisotropic RIE etching. Then monocrystalline silicon is grown selectively in the windows formed. Si-gate MOS transistors have been produced using this technology. In the field of bipolar transistors, reactive ion etching and selective low-pressure epitaxy has been used to optimize the Schottky collector transistor to a nearly one-dimensional structure. These transistors have been built on a submicrometer epitaxial layer.
Keywords :
Anisotropic magnetoresistance; Bipolar transistors; Epitaxial growth; Etching; Isolation technology; MOSFETs; Oxidation; Resists; Silicon; Very large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21330