• DocumentCode
    1087341
  • Title

    Supply current testing of mixed analogue and digital ICs

  • Author

    Bell, I.M. ; Taylor, G.

  • Author_Institution
    Dept. of Electron. Eng., VLSI, Hull, UK
  • Volume
    27
  • Issue
    17
  • fYear
    1991
  • Firstpage
    1581
  • Lastpage
    1583
  • Abstract
    A proposed extension of the technique of supply current monitoring to the testing of analogue circuit modules with the intention of developing a unified testing approach for mixed ASICs. Simulation results are reported to illustrate the effectiveness of the method.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; integrated circuit testing; mixed ASICs; mixed analogue and digital ICs; mixed mode ASICs; supply current monitoring; supply current testing; unified testing approach;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910990
  • Filename
    132817
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1087341