Title :
Supply current testing of mixed analogue and digital ICs
Author :
Bell, I.M. ; Taylor, G.
Author_Institution :
Dept. of Electron. Eng., VLSI, Hull, UK
Abstract :
A proposed extension of the technique of supply current monitoring to the testing of analogue circuit modules with the intention of developing a unified testing approach for mixed ASICs. Simulation results are reported to illustrate the effectiveness of the method.
Keywords :
CMOS integrated circuits; application specific integrated circuits; integrated circuit testing; mixed ASICs; mixed analogue and digital ICs; mixed mode ASICs; supply current monitoring; supply current testing; unified testing approach;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910990
